NIT Jalandhar

डा बी आर अम्बेडकर राष्ट्रीय प्रौद्योगिकी संस्थान, जालन्धर
Dr B R Ambedkar National Institute of Technology, Jalandhar

KEYSIGHT B2910BL Precision Source/Measure Unit

Department: Department of Physics
Concerned Person:
Name Mr. PARAMJIT MAHEY
Technical Assistant SG-II
Department of Physics
Email ID paramjitm@nitj.ac.in
Mobile No. 9888000211
Location:

Lab-309

Available For:

For Internal Users only

Major Specifications:

The Keysight B2910BL precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.

Measurement capabilities

  • configuration supports one-channel setup
  • minimum source resolution at 100 fA  / 1 μV, minimum measurement resolution at10 fA / 100 nV
  • maximum output at 210 V, 1.5 A DC
  • waveform generation (arbitrary) and digitizing capabilities from 50 μs interval

Key features

  • measurement capabilities with an integrated 4-quadrant source
  • color 4.3-inch color display supports both graphical and numerical view modes
  • application software to facilitate PC-based instrument control included at no charge
  • high throughput and SCPI command supporting conventional SMU command set
Research Potential:

The Keysight B2910BL precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.

Measurement capabilities

  • configuration supports one-channel setup
  • minimum source resolution at 100 fA  / 1 μV, minimum measurement resolution at10 fA / 100 nV
  • maximum output at 210 V, 1.5 A DC
  • waveform generation (arbitrary) and digitizing capabilities from 50 μs interval

Key features

  • measurement capabilities with an integrated 4-quadrant source
  • color 4.3-inch color display supports both graphical and numerical view modes
  • application software to facilitate PC-based instrument control included at no charge
  • high throughput and SCPI command supporting conventional SMU command set

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Developed by: Computer Centre, Dr. B.R. Ambedkar National Institute of Technology, Jalandhar